摘要
In this letter, the authors propose a practical and reliable approach-using deposited multiwalled carbon nanotubes (MWCNTs) as source and drain electrodes-for reducing the contact resistance (Rc) in pentacene-based bottom-contact thin-film transistors. The value of Rc of the devices was closely linked to the resultant length of the deposited MWCNTs; the lowest value was 3× 108 μm. The largest saturation mobility was 0.14 cm2 V s; this value reached up to three times higher when the threshold voltage was determined using the maximum transconductance (Gm,max) extrapolation method, rather than the constant current method. The on/off ratio was more than 106.
| 原文 | English |
|---|---|
| 文章編號 | 083502 |
| 期刊 | Applied Physics Letters |
| 卷 | 91 |
| 發行號 | 8 |
| DOIs | |
| 出版狀態 | Published - 2007 |
指紋
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