Pattern selection for testing of deep sub-micron timing defects

Mango*, Chia-Tso Chao, Li C. Wang, Kwang Ting Cheng

*此作品的通信作者

研究成果: Conference contribution同行評審

17 引文 斯高帕斯(Scopus)

摘要

Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating the test quality with respect to timing defects under process variations. Based on the proposed metric and a dynamic timing analyzer, we develop a pattern-selection algorithm for selecting the minimal number of patterns that can achieve the maximal test quality. To shorten the run time in dynamic timing analysis, we propose an algorithm to speed up the Monte-Carlo-based simulation. Our experimental results show that, selecting a small percentage of patterns from a multiple-detection transition fault pattern set is sufficient to maintain the test quality given by the entire pattern set. We present run-time and accuracy comparisons to demonstrate the efficiency and effectiveness of our pattern selection framework.

原文English
主出版物標題Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04
編輯G. Gielen, J. Figueras
頁面1060-1065
頁數6
DOIs
出版狀態Published - 12 7月 2004
事件Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04 - Paris, France
持續時間: 16 2月 200420 2月 2004

出版系列

名字Proceedings - Design, Automation and Test in Europe Conference and Exhibition
2

Conference

ConferenceProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04
國家/地區France
城市Paris
期間16/02/0420/02/04

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