Patch-Based Prototypical Cross-Scale Attention Network for Anomaly Detection

Tung Lin Wang, Jun Wei Hsieh*, Yi Kuan Hsieh

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

Anomaly detection and localization play crucial roles in industrial manufacturing to help maintain product quality and minimize defects. However, anomalies are rare and challenging to collect, leading to imbalance data that cause a biased model to be trained and sensitive to noisy or irrelevant features. In addition, anomalies are often subtle, diverse, and change over time, making them difficult to differentiate, further complicating the detection and localization tasks. To address these challenges, we propose a new Patch-based Protopical Cross-Scale Attention Network (PPCA-Net) to effectively identify anomaly regions by learning residual features across different scales and sizes, distinguishing abnormal from normal patterns. It consists of two key components: the Scale-Aware Channel Attention Module (SACAM) and the Patch-based Cross-Scale Attention Module (PCSAM). These modules facilitate interactive feature inferences across multiple scales, significantly enhancing the ability to capture abnormal features of various sizes in various environments. Furthermore, we incorporate diverse anomaly generation strategies, including multi-scale prototypes to better represent feature disparities between abnormal and normal patterns, thereby enhancing overall effectiveness. Through extensive experimentation on the challenging MVTec AD [1] benchmark, PPCA-Net demonstrates superior performance in both unsupervised and supervised methods, highlighting its effectiveness in anomaly identification.

原文English
主出版物標題Pattern Recognition - 27th International Conference, ICPR 2024, Proceedings
編輯Apostolos Antonacopoulos, Subhasis Chaudhuri, Rama Chellappa, Cheng-Lin Liu, Saumik Bhattacharya, Umapada Pal
發行者Springer Science and Business Media Deutschland GmbH
頁面366-381
頁數16
ISBN(列印)9783031781650
DOIs
出版狀態Published - 2025
事件27th International Conference on Pattern Recognition, ICPR 2024 - Kolkata, 印度
持續時間: 1 12月 20245 12月 2024

出版系列

名字Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
15302 LNCS
ISSN(列印)0302-9743
ISSN(電子)1611-3349

Conference

Conference27th International Conference on Pattern Recognition, ICPR 2024
國家/地區印度
城市Kolkata
期間1/12/245/12/24

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