Oxygen-dependent instability and annealing/passivation effects in amorphous In-Ga-Zn-O thin-film transistors

Wei Tsung Chen*, Shih Yi Lo, Shih Chin Kao, Hsiao-Wen Zan, Chuang Chuang Tsai, Jian Hong Lin, Chun Hsiang Fang, Chung Chun Lee

*此作品的通信作者

研究成果: Article同行評審

193 引文 斯高帕斯(Scopus)

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Keyphrases

Material Science

Engineering