摘要
In CMOS chips, the wider layout rules were traditionally applied to overcome latch-up issues. However, the chip area with wider layout rules was often enlarged, and in turn the chip cost was also increased. To effectively improve latch-up immunity without enlarging the chip area, circuit methods were therefore invented. An overview on circuit methodology used to prevent latch-up issues in CMOS integrated circuits (ICs) is presented in this article. The circuit solutions, including reducing the I/O pad trigger current, sensing the trigger current to control the power supply, and restarting the power supply through an MOS switch to shut off the latch-up current, are overviewed.
原文 | English |
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頁(從 - 到) | 1 |
頁數 | 1 |
期刊 | IEEE Journal of the Electron Devices Society |
DOIs | |
出版狀態 | Accepted/In press - 2022 |