Outlier Detection for Analog Tests Using Deep Learning Techniques

Keyphrases

• Deep Learning Methods 100%
• Analog Test 100%
• Outlier Detection 100%
• Neural Network 50%
• New Metric 50%
• Circuit Design 50%
• High Reliability 50%
• Increased Demand 50%
• Complex Circuit 50%
• Transistor Size 50%
• Failure Rate 50%
• Specific Information 50%
• Spatially Correlated 50%
• Area under the Curve 50%
• Industrial Data 50%
• Normalized Area 50%

Computer Science

• Outlier Detection 100%
• Deep Learning Technique 100%
• Network Density 100%
• Experimental Result 50%
• Neural Network 50%
• Statistical Approach 50%
• High Reliability 50%

Mathematics

• Outlier Detection 100%
• Deep Learning Method 100%
• Outlier 100%
• Defectives 66%
• Neural Network 33%
• Statistical Approach 33%
• Dice 33%
• Input Feature 33%