Optimization on SCR device with low capacitance for on-chip ESD protection in UWB RF circuits

Chun Yu Lin*, Ming-Dou Ker

*此作品的通信作者

    研究成果: Conference contribution同行評審

    指紋

    深入研究「Optimization on SCR device with low capacitance for on-chip ESD protection in UWB RF circuits」主題。共同形成了獨特的指紋。

    Engineering & Materials Science