@inproceedings{b54b959c2e344b90a064339aa0280a25,
title = "Optimization on On-Chip Surge Protection Device for USB Type-C HV Pins",
abstract = "On-chip surge protection device for VBUS pins in the USB type-C interfaces is studied. Comparing to the conventional PNP BJT device, the proposed PNP BJT can effectively boost its immunity against surge and ESD stresses. Silicon chip fabricated in a 0.15-μm BCD technology has been measured to successfully verify the surge immunity of the proposed PNP BJT. ",
keywords = "PNP BJT, Surge protection device, USB type-C",
author = "Chen, {Ming Chun} and Ker, {Ming Dou} and Jou, {Yeh Ning} and Lee, {Jian Hsing}",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.; 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020 ; Conference date: 20-07-2020 Through 23-07-2020",
year = "2020",
month = jul,
day = "20",
doi = "10.1109/IPFA49335.2020.9261023",
language = "English",
series = "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020",
address = "United States",
}