摘要
We have studied the temperature dependence of the band gap and the decay dynamics of isoelectronic ZnSe1-xOx (x=0-0.053) semiconductors, using photoluminescence (PL) and time-resolved PL spectroscopy. The temperature dependence of the band gap of ZnSe1-xOx decreases with the increase in O concentration. The Kohlrausch law is in good agreement with the O-induced complex decay profiles. As temperature increases, the mechanism of carrier decay undergoes a complicated change from trapped to free excitons. These findings are consistent with the temperature dependence of the stretching exponent β.
原文 | English |
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頁(從 - 到) | 122-126 |
頁數 | 5 |
期刊 | Journal of Crystal Growth |
卷 | 323 |
發行號 | 1 |
DOIs | |
出版狀態 | Published - 15 5月 2011 |