跳至主導覽
跳至搜尋
跳過主要內容
國立陽明交通大學研發優勢分析平台 首頁
English
中文
首頁
人員
單位
研究成果
計畫
獎項
活動
貴重儀器
影響
按專業知識、姓名或所屬機構搜尋
Optical and photoelectrochemical studies on Ag
2
O/TiO
2
double-layer thin films
Chuan Li
*
, J. H. Hsieh, J. C. Cheng, C. C. Huang
*
此作品的通信作者
照明與能源光電研究所
研究成果
:
Article
›
同行評審
21
引文 斯高帕斯(Scopus)
總覽
指紋
指紋
深入研究「Optical and photoelectrochemical studies on Ag
2
O/TiO
2
double-layer thin films」主題。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Keyphrases
Rutile
100%
Silver Nitrate
100%
Optical Studies
100%
Double-layer Thin Films
100%
Photoelectrochemical Studies
100%
Double Layer
42%
TiO2 Film
42%
Scanning Electron Microscope
28%
X Ray Diffraction
28%
Photoluminance
28%
Band Gap
28%
Optical Absorption
28%
UV-Vis-NIR
28%
Film Thickness
14%
Glass Substrate
14%
Conduction Band
14%
Valence Band
14%
Microstructure
14%
Oxide Film
14%
Energy Storage
14%
Two-band
14%
Copper(II) Oxide
14%
Upper Layer
14%
Photogenerated Electrons
14%
Electron Transfer
14%
Photoelectrochemical
14%
Morphological Structure
14%
X-ray Scanning
14%
Electron-hole Recombination
14%
Beer-Lambert Law
14%
Photoelectrical
14%
DC Reactive Magnetron Sputtering
14%
NIR Spectra
14%
Optical Band
14%
Stacked Film
14%
Double-layer Film
14%
Single Film
14%
Tauc Plot
14%
Delayed Emissions
14%
Physics
Electron Microscope
100%
Thin Films
100%
X Ray Diffraction
100%
Electromagnetic Absorption
100%
Ultraviolet Spectrum
100%
Film Thickness
50%
Holes (Electron Deficiencies)
50%
Magnetron
50%
Oxide Film
50%
Energy Storage
50%
Engineering
Thin Films
100%
Double Layer
100%
Ray Diffraction
40%
Band Gap
40%
Scanning Electron Microscope
40%
Absorptivity
40%
Valence Band
20%
Magnetron
20%
Oxide Film
20%
Energy Storage
20%
Layer Film
20%
Reactive Sputtering
20%
Excited Electron
20%
Beer-Lambert Law
20%
Conduction Band
20%
Glass Substrate
20%
Material Science
Thin Films
100%
Titanium Dioxide
100%
Film
75%
X-Ray Diffraction
25%
Scanning Electron Microscopy
25%
Film Thickness
12%
Electron Transfer
12%
Oxide Film
12%