On the poor-verdú conjecture for the reliability function of channels with memory

F. Alajaji*, Po-Ning Chen, Z. Rached

*此作品的通信作者

研究成果: Conference article同行評審

摘要

In a previous work, Poor and Verdú established an upper bound to the reliability function of arbitrary single-user discrete-time channels with memory. They also conjectured that their bound is tight for all coding rates. In this work, we demonstrate via a counterexample involving memoryless binary erasure channels that the Poor-Vendú upper bound is, unfortunately, not tight at low rates. We also examine possible improvements to this bound.

原文American English
頁數1
期刊IEEE International Symposium on Information Theory - Proceedings
DOIs
出版狀態Published - 12 9月 2001
事件2001 IEEE International Symposium on Information Theory (ISIT 2001) - Washington, DC, United States
持續時間: 24 6月 200129 6月 2001

指紋

深入研究「On the poor-verdú conjecture for the reliability function of channels with memory」主題。共同形成了獨特的指紋。

引用此