On the poor-verdú conjecture for the reliability function of channels with memory

F. Alajaji*, Po-Ning Chen, Z. Rached

*此作品的通信作者

研究成果: Conference article同行評審

摘要

In a previous work, Poor and Verdú established an upper bound to the reliability function of arbitrary single-user discrete-time channels with memory. They also conjectured that their bound is tight for all coding rates. In this work, we demonstrate via a counterexample involving memoryless binary erasure channels that the Poor-Vendú upper bound is, unfortunately, not tight at low rates. We also examine possible improvements to this bound.

原文American English
頁(從 - 到)124
頁數1
期刊IEEE International Symposium on Information Theory - Proceedings
DOIs
出版狀態Published - 2001
事件2001 IEEE International Symposium on Information Theory (ISIT 2001) - Washington, DC, 美國
持續時間: 24 6月 200129 6月 2001

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