@inproceedings{e5bc94200710445ebdf4d2cca680125c,
title = "On-panel electrostatic discharge (ESD) protection design with thin-film transistor in LTPS process",
abstract = "The electrostatic discharge (ESD) robustness of diode-connected n-type thin-film transistors (N-TFTs) and diode-connected p-type thin-film transistors (P-TFTs) with different layout structures in a given low-temperature polycrystalline silicon (LTPS) process is investigated. By using the wafer-level transmission line pulsing (TLP) system, the high-current transient characteristics and the secondary breakdown current (It2) levels of the diode-connected TFTs under different device parameters and layout structures are directly measured on the glass substrate. Finally, one set of design rules for on-panel ESD protection design is suggested.",
keywords = "Electrostatic discharge (ESD)Transmission line pulsing (TLP) system, Low-temperature polycrystalline silicon (LTPS), Thin-film transistors (TFTs)",
author = "Ming-Dou Ker and Chuang, {Jie Yao} and Deng, {Chih Kang} and Kuo, {Chung Hong} and Li, {Chun Huai} and Lai, {Ming Sheng} and Wang, {Chih Wei} and Liu, {Chun Ting}",
year = "2007",
month = mar,
language = "English",
isbn = "9787561752289",
series = "AD'07 - Proceedings of Asia Display 2007",
pages = "551--556",
booktitle = "AD'07 - Proceedings of Asia Display 2007",
note = "Asia Display 2007, AD'07 ; Conference date: 12-03-2007 Through 16-03-2007",
}