On electronic structure and geometry of MoX2 (X = S, Se, Te) and black phosphorus by ab initio Simulation with various van der waals corrections

Yi Chia Tsai, Yiming Li

研究成果: Conference contribution同行評審

5 引文 斯高帕斯(Scopus)

摘要

To get an accurate prediction of the geometry and electronic structure of two-dimensional materials, the use of functionals for the exchange-correlation and the van der Waals corrections are consequential. We present a more rigorous simulation procedure by adopting different exchange-correlation functionals for geometry relaxation and electronic structure calculation. As the results, by using Perdew-Burke-Ernzerhof (PBE) functional, the geometry and the bandgap of the bulk transition metals dichalcogenides can be satisfied in comparison with the experimental measurement. It should, however, incorporate the Heyd-Scuseria-Ernzerhof (HSE06) functional and DFT-D2 van der Waals correction at the same time to reproduce a close geometry and bandgap of bulk black phosphorus (BP). A large cell calculation for BP, such as contact engineering and doping engineering, can thus take the advantage of accuracy while remains time efficiency.

原文English
主出版物標題2017 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面169-172
頁數4
ISBN(電子)9784863486102
DOIs
出版狀態Published - 25 10月 2017
事件2017 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2017 - Kamakura, Japan
持續時間: 7 9月 20179 9月 2017

出版系列

名字International Conference on Simulation of Semiconductor Processes and Devices, SISPAD
2017-September

Conference

Conference2017 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2017
國家/地區Japan
城市Kamakura
期間7/09/179/09/17

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