@inproceedings{f2ac80d6feec4ee5aac32d7c7ccec33d,
title = "On-chip transient detection circuit for system-level ESD protection in CMOS ICs",
abstract = "A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed in this paper. The circuit performance to detect different positive and negative fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.13-μm CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping. The proposed transient detection circuit can be further cooperated with power-on reset circuit to improve the immunity of CMOS IC products against system-level ESD stress.",
author = "Ming-Dou Ker and Yen, {Cheng Cheng} and Shih, {Pi Chia}",
year = "2006",
doi = "10.1109/CICC.2006.320949",
language = "English",
isbn = "1424400767",
series = "Proceedings of the Custom Integrated Circuits Conference",
pages = "361--364",
booktitle = "Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006",
note = "IEEE 2006 Custom Integrated Circuits Conference, CICC 2006 ; Conference date: 10-09-2006 Through 13-09-2006",
}