On-Chip Transient Detection Circuit for Microelectronic Systems Against Electrical Transient Disturbances due to ESD Events

Wen Chieh Chen, Ming-Dou Ker

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

A new on-chip transient detection circuit which can detect electrical disturbances of system-level electrostatic discharge (ESD) is proposed. The circuit is designed with reduced physical area by utilizing dual-latched structure. With hardware/firmware co-design method, auto-recovery procedure can be activated by the detection circuit when microelectronic systems suffer system-level ESD events. The immunity level of microelectronic products against the electromagnetic interference (EMI) of ESD events can be effectively improved. The proposed on-chip transient detection circuit has been verified in a 0.18-\boldsymbol{\mu}\mathbf{m} eMos process with 1.8-V devices under system-level ESD tests.

原文English
主出版物標題2018 IEEE Region 10 Symposium, Tensymp 2018
發行者Institute of Electrical and Electronics Engineers Inc.
頁面36-39
頁數4
ISBN(電子)9781538669891
DOIs
出版狀態Published - 2 七月 2018
事件2018 IEEE Region 10 Symposium, Tensymp 2018 - Sydney, Australia
持續時間: 1 七月 20186 七月 2018

出版系列

名字2018 IEEE Region 10 Symposium, Tensymp 2018

Conference

Conference2018 IEEE Region 10 Symposium, Tensymp 2018
國家/地區Australia
城市Sydney
期間1/07/186/07/18

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