@inproceedings{7aa4b1d23085491ab2c725cb2fb449a9,
title = "On-Chip Surge Protection Structure with High Surge Robustness for USB PD 3.1 Applications",
abstract = "An on-chip surge protection device for VBUS pins in the USB type-C interfaces is optimized to comply with USB Power Delivery (PD) 3.1 specification. Compared to the traditional PNP BJT, the new proposed PNP BJT with inserted base layout can reach higher surge and ESD robustness with relatively small area. The proposed devices fabricated in a 0.18-μm BCD technology have been measured by surge, HBM, and TLP tests to verify their immunity.",
keywords = "PNP BJT, Surge protection device, USB type-C",
author = "Ho, {Wen Yung} and Ker, {Ming Dou}",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2023 ; Conference date: 24-07-2023 Through 27-07-2023",
year = "2023",
doi = "10.1109/IPFA58228.2023.10249102",
language = "English",
series = "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2023",
address = "美國",
}