@inproceedings{2d3af535782146ceaf812f11b84a9103,
title = "On-chip ESD protection design for HV integrated circuits",
abstract = "Electrostatic discharge (ESD) protection has been an important reliability issue to CMOS integrated circuits, especially in high-voltage (HV) applications. In this invited talk, a brief overview on ESD protection designs for HV integrated circuits is presented. The useful and safe solutions are highlighted for real applications in HV IC products.",
keywords = "ESD protection, high-voltage (HV) IC",
author = "Ming-Dou Ker",
year = "2016",
month = oct,
day = "12",
doi = "10.1109/INEC.2016.7589428",
language = "English",
series = "Proceedings - International NanoElectronics Conference, INEC",
publisher = "IEEE Computer Society",
booktitle = "7th IEEE International Nanoelectronics Conference 2016, INEC 2016",
address = "United States",
note = "7th IEEE International Nanoelectronics Conference, INEC 2016 ; Conference date: 09-05-2016 Through 11-05-2016",
}