@inproceedings{8410911aaedb49c99aa25089606d0abd,
title = "On-chip ESD detection circuit for system-level ESD protection design",
abstract = "A new on-chip CR-based electrostatic discharge (ESD) detection circuit for system-level ESD protection design is proposed in this work. The circuit performance to detect positive or negative electrical transients generated by system-level ESD tests has been analyzed in HSPICE simulation and verified in silicon chip. The experimental results in a 0.13-μm CMOS process have confirmed that the proposed detection circuit can detect ESD-induced transient disturbance during system-level ESD zapping. The detection results can be used as system recovery firmware index to improve the immunity of CMOS IC products against system-level ESD stress.",
author = "Ming-Dou Ker and Lin, {Wan Yen} and Yen, {Cheng Cheng} and Yang, {Che Ming} and Chen, {Tung Yang} and Chen, {Shih Fan}",
year = "2010",
month = dec,
day = "1",
doi = "10.1109/ICSICT.2010.5667447",
language = "English",
isbn = "9781424457984",
series = "ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings",
pages = "1584--1587",
booktitle = "ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings",
note = "2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology ; Conference date: 01-11-2010 Through 04-11-2010",
}