On a software-based self-test methodology and its application

Charles H.P. Wen, Li C. Wang, Kwang Ting Cheng, Kai Yang, Wei Ting Liu, Ji Jan Chen

研究成果: Conference contribution同行評審

20 引文 斯高帕斯(Scopus)

摘要

Software-based self-test (SBST) was originally proposed for cost reduction in SOC test environment. Previous studies have focused on using SBST for screening logic defects. SBST is functional-based and hence, achieving a high fullchip logic defect coverage can be a challenge. This raises the question of SBST's applicability in practice. In this paper, we investigate a particular SBST methodology and study its potential applications. We conclude that the SBST methodology can be very useful for producing speed binning tests. To demonstrate the advantage of using SBST in at-speed functional testing, we develop a SBST framework and apply it to an open source microprocessor core, named OpenRISC 1200. A delay path extraction methodology is proposed in conjunction with the SBST framework. The experimental results demonstrate that our SBST can produce tests for a high percentage of extracted delay paths of which less than half of them would likely be detected through traditional functional test patterns. Moreover, the SBST tests can exercise the functional worst-case delays which could not be reached by even 1M of traditional verification test patterns. The effectiveness of our SBST and its current limitations are explained through these experimental findings.

原文English
主出版物標題Proceedings - 23rd IEEE VLSI Test Symposium, VTS 2005
頁面107-113
頁數7
DOIs
出版狀態Published - 1 十二月 2005
事件23rd IEEE VLSI Test Symposium, VTS 2005 - Palm Springs, CA, United States
持續時間: 1 五月 20055 五月 2005

出版系列

名字Proceedings of the IEEE VLSI Test Symposium

Conference

Conference23rd IEEE VLSI Test Symposium, VTS 2005
國家/地區United States
城市Palm Springs, CA
期間1/05/055/05/05

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