Observation of dislocation etch pits in epitaxial lateral overgrowth GaN by wet chemical etching

T. C. Wen*, S. C. Lee, H. S. Chuang, C. H. Chiou, Wei-I Lee

*此作品的通信作者

研究成果: Conference article同行評審

1 引文 斯高帕斯(Scopus)

指紋

深入研究「Observation of dislocation etch pits in epitaxial lateral overgrowth GaN by wet chemical etching」主題。共同形成了獨特的指紋。

Keyphrases

Material Science