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Novel Topology with Continuous Switching to Comprehensively Characterize Trapping-induced Dynamics in GaN Power Devices

  • Ming Cheng Lin*
  • , Chao Ta Fan
  • , Shun Wei Tang
  • , Tian Li Wu*
  • , Chih Fang Huang
  • *此作品的通信作者

研究成果: Conference contribution同行評審

8 引文 斯高帕斯(Scopus)

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Engineering