摘要
We have successfully fabricated the symmetric vertical-channel Ni-salicided polycrystalline silicon thin-film transistors (VSA-TFTs) for the first time. The transfer characteristics of VSA-TFTs show a sharp turning between subthreshold and on state. The off -state currents can be improved by a modified overetching of oxide, equivalent dual-gate structure, and n+ floating-region length. The on-state currents can be enhanced by Ni-salicidation. The VSA-TFTs display a good subthreshold swing of 220 mV/dec, steep mobility increase (field-effect mobility of 76 cm2/Vċs), and large on/off-current ratio of more than 109(IOFF = 4×10-14\ ION=7×10-5 and W mask/Lmask =\break \hbox10μm/3μm).
原文 | English |
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文章編號 | 5559329 |
頁(從 - 到) | 1233-1235 |
頁數 | 3 |
期刊 | IEEE Electron Device Letters |
卷 | 31 |
發行號 | 11 |
DOIs | |
出版狀態 | Published - 1 11月 2010 |