Novel circuit-level model for gate oxide short and its testing method in SRAMs

Chen Wei Lin, Chia-Tso Chao, Chih Chieh Hsu

研究成果: Article同行評審

4 引文 斯高帕斯(Scopus)

指紋

深入研究「Novel circuit-level model for gate oxide short and its testing method in SRAMs」主題。共同形成了獨特的指紋。

Engineering & Materials Science