Novel approach for functional coverage measurement in HDL

Chien-Nan Liu*, Chen Yi Chang, Jing Yang Jou, Ming Chih Lai, Hsing Ming Juan

*此作品的通信作者

研究成果: Conference article同行評審

13 引文 斯高帕斯(Scopus)

摘要

While the coverage-driven functional verification is getting popular, a fast and convenient coverage measurement tool is necessary. In this paper, we propose a novel approach for functional coverage measurement based on the VCD files produced by the simulators. The usage flow of the proposed dumpfile-based coverage analysis is much easier and smoother than that of existing instrumentation-based coverage tools. No pre-processing tool is required and no extra code will be inserted into the source code. Most importantly, the flexibility in choosing coverage metrics and measured code regions is increased. Only one simulation run is needed for any kind of coverage reports. By conducting some experiments on real examples, it shows very promising results in terms of the performance and the accuracy of coverage reports.

原文English
頁(從 - 到)IV-217-IV-220
期刊Proceedings - IEEE International Symposium on Circuits and Systems
4
DOIs
出版狀態Published - 2000
事件Proceedings of the IEEE 2000 International Symposium on Circuits and Systems - Geneva, Switz
持續時間: 28 5月 200031 5月 2000

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