Noninterfering Optical Method of HBT Circuit Evaluation

K. C. Wang, P. M. Asbeck, Mau-Chung Chang, G. J. Sullivan, H. F. Basit, D. L. Miller*

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    摘要

    We report a novel noninterfering and simple approach for evaluation of circuits implemented with AlGaAs/GaAs heterojunction bipolar transistors (HBTs). This method makes use of radiative recombination in the base region of current-carrying HBTs. The infra-red radiation emitted is ‘visible’ to the closed-circuit TV (CCTV) cameras. Therefore, one can view the operation of the HBT circuit under test at normal biases with a TV monitor. This method can be used to determine logic states of gates, as well as collector current of individual HBTs within integrated circuits.

    原文English
    頁(從 - 到)1111-1112
    頁數2
    期刊Electronics Letters
    25
    發行號17
    DOIs
    出版狀態Published - 3 8月 1989

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