Noninterfering Optical Method of HBT Circuit Evaluation

K. C. Wang; P. M. Asbeck; Mau-Chung Chang; G. J. Sullivan; H. F. Basit; D. L. Miller

doi:10.1049/el:19890745

Noninterfering Optical Method of HBT Circuit Evaluation

K. C. Wang, P. M. Asbeck, Mau-Chung Chang, G. J. Sullivan, H. F. Basit, D. L. Miller^*

^*此作品的通信作者

研究成果: Article › 同行評審

摘要

We report a novel noninterfering and simple approach for evaluation of circuits implemented with AlGaAs/GaAs heterojunction bipolar transistors (HBTs). This method makes use of radiative recombination in the base region of current-carrying HBTs. The infra-red radiation emitted is ‘visible’ to the closed-circuit TV (CCTV) cameras. Therefore, one can view the operation of the HBT circuit under test at normal biases with a TV monitor. This method can be used to determine logic states of gates, as well as collector current of individual HBTs within integrated circuits.

原文	English
頁（從 - 到）	1111-1112
頁數	2
期刊	Electronics Letters
卷	25
發行號	17
DOIs	https://doi.org/10.1049/el:19890745
出版狀態	Published - 3 8月 1989

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10.1049/el:19890745

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title = "Noninterfering Optical Method of HBT Circuit Evaluation",

abstract = "We report a novel noninterfering and simple approach for evaluation of circuits implemented with AlGaAs/GaAs heterojunction bipolar transistors (HBTs). This method makes use of radiative recombination in the base region of current-carrying HBTs. The infra-red radiation emitted is {\textquoteleft}visible{\textquoteright} to the closed-circuit TV (CCTV) cameras. Therefore, one can view the operation of the HBT circuit under test at normal biases with a TV monitor. This method can be used to determine logic states of gates, as well as collector current of individual HBTs within integrated circuits.",

keywords = "Bipolar devices, Integrated circuits, Optical measurement, Transistors",

author = "Wang, {K. C.} and Asbeck, {P. M.} and Mau-Chung Chang and Sullivan, {G. J.} and Basit, {H. F.} and Miller, {D. L.}",

year = "1989",

month = aug,

day = "3",

doi = "10.1049/el:19890745",

language = "English",

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T1 - Noninterfering Optical Method of HBT Circuit Evaluation

AU - Wang, K. C.

AU - Asbeck, P. M.

AU - Chang, Mau-Chung

AU - Sullivan, G. J.

AU - Basit, H. F.

AU - Miller, D. L.

PY - 1989/8/3

Y1 - 1989/8/3

N2 - We report a novel noninterfering and simple approach for evaluation of circuits implemented with AlGaAs/GaAs heterojunction bipolar transistors (HBTs). This method makes use of radiative recombination in the base region of current-carrying HBTs. The infra-red radiation emitted is ‘visible’ to the closed-circuit TV (CCTV) cameras. Therefore, one can view the operation of the HBT circuit under test at normal biases with a TV monitor. This method can be used to determine logic states of gates, as well as collector current of individual HBTs within integrated circuits.

AB - We report a novel noninterfering and simple approach for evaluation of circuits implemented with AlGaAs/GaAs heterojunction bipolar transistors (HBTs). This method makes use of radiative recombination in the base region of current-carrying HBTs. The infra-red radiation emitted is ‘visible’ to the closed-circuit TV (CCTV) cameras. Therefore, one can view the operation of the HBT circuit under test at normal biases with a TV monitor. This method can be used to determine logic states of gates, as well as collector current of individual HBTs within integrated circuits.

KW - Bipolar devices

KW - Integrated circuits

KW - Optical measurement

KW - Transistors

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U2 - 10.1049/el:19890745

DO - 10.1049/el:19890745

M3 - Article

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VL - 25

SP - 1111

EP - 1112

JO - Electronics Letters

JF - Electronics Letters

SN - 0013-5194

IS - 17

ER -

Noninterfering Optical Method of HBT Circuit Evaluation

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