@inproceedings{3cb5f87252a442db8691618d756c444e,
title = "New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels",
abstract = "A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD tests has been evaluated in HSPICE simulation and verified in 0.13-nm silicon chip. The output signal of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware system co-design, the immunity of display panels against transient disturbance under system-level ESD tests can be enhanced.",
keywords = "detection circuit, electrostatic discharge (ESD), system-level ESD test",
author = "Yen, {Cheng Cheng} and Lin, {Wan Yen} and Ming-Dou Ker and Yang, {Che Ming} and Chen, {Shih Fan} and Chen, {Tung Yang}",
year = "2011",
month = aug,
day = "31",
doi = "10.1109/DTIS.2011.5941441",
language = "English",
isbn = "9781612848990",
series = "6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program",
booktitle = "6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program",
note = "6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 ; Conference date: 06-04-2011 Through 08-04-2011",
}