New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels

Cheng Cheng Yen*, Wan Yen Lin, Ming-Dou Ker, Che Ming Yang, Shih Fan Chen, Tung Yang Chen

*此作品的通信作者

    研究成果: Conference contribution同行評審

    摘要

    A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD tests has been evaluated in HSPICE simulation and verified in 0.13-nm silicon chip. The output signal of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware system co-design, the immunity of display panels against transient disturbance under system-level ESD tests can be enhanced.

    原文English
    主出版物標題6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program
    DOIs
    出版狀態Published - 31 8月 2011
    事件6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Athens, Greece
    持續時間: 6 4月 20118 4月 2011

    出版系列

    名字6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11 - Technical Program

    Conference

    Conference6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11
    國家/地區Greece
    城市Athens
    期間6/04/118/04/11

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