@inproceedings{602ac7eaf3354a1383846da1ed6c918a,
title = "New transient detection circuit for system-level ESD protection",
abstract = "A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. By including this new proposed on-chip transient detection circuit, a hardware/firmware solution cooperated with power-on reset circuit can be co-designed to fix the system-level ESD issues. The circuit performance to detect different positive and negative ESD-induced fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping.",
author = "Yen, {Cheng Cheng} and Liao, {Chi Sheng} and Ming-Dou Ker",
year = "2008",
doi = "10.1109/VDAT.2008.4542442",
language = "English",
isbn = "9781424416172",
series = "2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT",
pages = "180--183",
booktitle = "2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT",
note = "2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT ; Conference date: 23-04-2008 Through 25-04-2008",
}