New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels

Ming-Dou Ker*, Wan Yen Lin, Cheng Cheng Yen, Che Ming Yang, Tung Yang Chen, Shih Fan Chen

*此作品的通信作者

    研究成果: Conference contribution同行評審

    7 引文 斯高帕斯(Scopus)

    摘要

    A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE simulation and verified in silicon chip. The output of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware co-design, the immunity of display panel against transient disturbance under EFT tests can be significantly improved.

    原文English
    主出版物標題2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
    頁面51-54
    頁數4
    DOIs
    出版狀態Published - 20 8月 2010
    事件2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, France
    持續時間: 2 6月 20104 6月 2010

    出版系列

    名字2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

    Conference

    Conference2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
    國家/地區France
    城市Grenoble
    期間2/06/104/06/10

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