New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems

Xiao Rui Kang, Ming-Dou Ker

研究成果: Conference contribution同行評審

摘要

A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is presented in this work. The circuit simulation and experimental results with silicon testchip in a 0.18-um CMOS process have confirmed that the new proposed circuit can successfully detect the occurrence of system-level ESD-induced electrical transient disturbance. The detection output can be used as system recovery index to restore the system from frozen or upset state to a stable and known state. Therefore, the immunity of microelectronic products against the system-level ESD test can be effectively enhanced.

原文English
主出版物標題EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1-2
頁數2
ISBN(電子)9781538629079
DOIs
出版狀態Published - 1 12月 2017
事件13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017 - Hsinchu, 台灣
持續時間: 18 10月 201720 10月 2017

出版系列

名字EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
2017-January

Conference

Conference13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017
國家/地區台灣
城市Hsinchu
期間18/10/1720/10/17

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