@inproceedings{6ef929a8bf5b4ee7a87d833875de3f21,
title = "New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems",
abstract = "A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is presented in this work. The circuit simulation and experimental results with silicon testchip in a 0.18-um CMOS process have confirmed that the new proposed circuit can successfully detect the occurrence of system-level ESD-induced electrical transient disturbance. The detection output can be used as system recovery index to restore the system from frozen or upset state to a stable and known state. Therefore, the immunity of microelectronic products against the system-level ESD test can be effectively enhanced.",
keywords = "Electromagnetic susceptibility (EMS), Electrostatic discharge (ESD), System-level ESD, Transient detection circuit",
author = "Kang, {Xiao Rui} and Ming-Dou Ker",
year = "2017",
month = dec,
day = "1",
doi = "10.1109/EDSSC.2017.8126515",
language = "English",
series = "EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1--2",
booktitle = "EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits",
address = "United States",
note = "13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017 ; Conference date: 18-10-2017 Through 20-10-2017",
}