NEW METHOD OF MEASURING DIFFUSION LENGTH AND SURFACE RECOMBINATION VELOCITY.

Keyphrases

• Bias Voltage 33%
• Bulk Material 33%
• Bulk Thickness 33%
• Chopped Light 33%
• Constant Intensity 33%
• Curve Fitting 33%
• Diffusion Length 100%
• Effective Surface 33%
• Gate Electrode 33%
• Photocurrent 33%
• Recombination Velocity 33%
• Reverse Bias 33%
• Silicon Surface 33%
• Surface Recombination Velocity 100%
• Test Cell 33%
• Transparent Gate 33%

Engineering

• Bias Voltage 33%
• Bulk Material 33%
• Diffusion Length 100%
• Fitting Curve 33%
• Gate Electrode 33%
• Photocurrent 33%
• Reverse Bias 33%
• Silicon Surface 33%
• Surface Recombination Velocity 100%
• Test Cell 33%