New layout scheme to improve ESD robustness of I/O buffers in fully-silicided CMOS process

Ming-Dou Ker*, Wen Yi Chen, Wuu Trong Shieh, I. Ju Wei

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    研究成果: Conference contribution › 同行評審

    2 引文 斯高帕斯（Scopus）

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    Earth and Planetary Sciences

    Engineering

    Material Science