New Energy Transformation Model for the Unclamped Inductive Switching (UIS) Test

Iian Hsing Lee*, Kamna Nidhi, Chun Chih Chen, Ming Dou Ker

*此作品的通信作者

研究成果: Conference contribution同行評審

3 引文 斯高帕斯(Scopus)

摘要

Energy handling capability based on the inductive load is one of the major concerns for the automotive applications. In this paper, a new unclamped inductive switching (UIS) test model is proposed that accounts for the impact of inductance on measurements for the first time. During the measurement it is found that the inductance at the current ramp-up period is higher than that at the current ramp-down period due to the hysteresis induced inductance decrease. Based on two different inductances for two different periods, the UIS test model is proposed and validated that can well match with the measured experimental results.

原文English
主出版物標題2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781728161693
DOIs
出版狀態Published - 20 7月 2020
事件2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020 - Singapore, Singapore
持續時間: 20 7月 202023 7月 2020

出版系列

名字Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
2020-July

Conference

Conference2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020
國家/地區Singapore
城市Singapore
期間20/07/2023/07/20

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