TY - GEN
T1 - New design of transient-noise detection circuit with SCR device for system-level ESD protection
AU - Ker, Ming-Dou
AU - Lin, Wan Yen
PY - 2012/11/7
Y1 - 2012/11/7
N2 - A new SCR-based transient detection circuit for on-chip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level ESD-induced electrical transient events. The detection output can be cooperated with firmware operation to automatically execute system recovery procedure, therefore the immunity of microelectronic systems against system-level ESD test can be effectively improved.
AB - A new SCR-based transient detection circuit for on-chip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level ESD-induced electrical transient events. The detection output can be cooperated with firmware operation to automatically execute system recovery procedure, therefore the immunity of microelectronic systems against system-level ESD test can be effectively improved.
UR - http://www.scopus.com/inward/record.url?scp=84868281080&partnerID=8YFLogxK
U2 - 10.1109/NEWCAS.2012.6328961
DO - 10.1109/NEWCAS.2012.6328961
M3 - Conference contribution
AN - SCOPUS:84868281080
SN - 9781467308595
T3 - 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
SP - 81
EP - 84
BT - 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
T2 - 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
Y2 - 17 June 2012 through 20 June 2012
ER -