New design of transient-noise detection circuit with SCR device for system-level ESD protection

Ming-Dou Ker*, Wan Yen Lin

*此作品的通信作者

    研究成果: Conference contribution同行評審

    3 引文 斯高帕斯(Scopus)

    摘要

    A new SCR-based transient detection circuit for on-chip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level ESD-induced electrical transient events. The detection output can be cooperated with firmware operation to automatically execute system recovery procedure, therefore the immunity of microelectronic systems against system-level ESD test can be effectively improved.

    原文English
    主出版物標題2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
    頁面81-84
    頁數4
    DOIs
    出版狀態Published - 7 11月 2012
    事件2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012 - Montreal, QC, Canada
    持續時間: 17 6月 201220 6月 2012

    出版系列

    名字2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012

    Conference

    Conference2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
    國家/地區Canada
    城市Montreal, QC
    期間17/06/1220/06/12

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