Network characteristics and patent value—evidence from the light-emitting diode industry

Way Ren Huang, Chia Jen Hsieh, Ke Chiun Chang*, Yen Jo Kiang, Chien Chung Yuan, Woei Chyn Chu

*此作品的通信作者

研究成果: Article同行評審

4 引文 斯高帕斯(Scopus)

摘要

This study proposes a different angle to social network analysis that evaluates patent value and explores its influencing factors using the network centrality and network position. This study utilizes a logistic regression model to explore the relationships in the LED industry between patent value and network centrality as measured from out-degree centrality, in-degree centrality, in-closeness centrality, and network position, which is measured from effect size. The empirical result shows that out-degree centrality and in-degree centrality have significant positive effects on patent value and that effect size has a significant negative effect on patent value.

原文English
文章編號e0181988
期刊PLoS ONE
12
發行號8
DOIs
出版狀態Published - 8月 2017

指紋

深入研究「Network characteristics and patent value—evidence from the light-emitting diode industry」主題。共同形成了獨特的指紋。

引用此