Negative correlation between charge carrier density and mobility fluctuations in graphene

Jianming Lu, Jie Pan, Sheng-Shiuan Yeh, Haijing Zhang, Yuan Zheng, Qihong Chen, Zhe Wang, Bing Zhang, Juhn-Jong Lin, Ping Sheng

研究成果: Article同行評審

12 引文 斯高帕斯(Scopus)

摘要

By carrying out simultaneous longitudinal and Hall measurements in graphene, we find that the 1/f noise for the charge carrier density is negatively correlated to that of mobility, with a governing behavior that differs significantly from the relation between their mean values. The correlation in the noise data can be quantitatively explained by a single-parameter theory whose underlying physics is the trapping and detrapping of the fluctuating charge carriers by the oppositely charged Coulomb scattering centers. This can alter the effective density of long-range scattering centers in a transient manner, with the consequent fluctuating effect on the mobility.

原文English
文章編號085434
頁數9
期刊Physical Review B - Condensed Matter and Materials Physics
90
發行號8
DOIs
出版狀態Published - 26 8月 2014

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