NBL Causing Low Latch-up Immunity between HV-PMOS and LV-P/NMOS in a 0.15-μm BCD Process

Chao Yang Chen, Jian Hsing Lee, Karuna Nidhi, Tzer Yaa Bin, Geeng Lih Lin, Ming-Dou Ker

研究成果: Conference contribution › 同行評審

4 引文 斯高帕斯（Scopus）

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Keyphrases

Engineering