TY - GEN
T1 - Nanowire field effect transistor with its sub-picomolar label-free biosensing capability toward a gene mutation
AU - Wu, Chi Chang
AU - Ko, Fu-Hsiang
AU - Su, Ting Siang
AU - Li, Bo Syuan
AU - Wu, Wen Fa
PY - 2010/5/5
Y1 - 2010/5/5
N2 - We describe the efficiency of deoxyribonucleic acid (DNA) immobilization onto a nanowire (NW) after employing various surface cleaning methods. From surface tension measurements and fluorescence microscopy images of the silicon oxide surfaces, we determined that the effectiveness of surface cleaning using an acetone/ethanol mixture was similar to that of piranha solution (sulfuric acid/hydrogen peroxide). Thus, we employed surface cleaning with an acetone/ethanol mixture en route toward the fabrication of a series of label-free, back-gated, 60-nm nanowire field-effect transistor (NWFET) sensors for the detection of the BRAFV599E oncogene. We applied the NWFET sensor to the successful detection of the hybridization and dehybridization processes of the BRAFV599E mutation gene.
AB - We describe the efficiency of deoxyribonucleic acid (DNA) immobilization onto a nanowire (NW) after employing various surface cleaning methods. From surface tension measurements and fluorescence microscopy images of the silicon oxide surfaces, we determined that the effectiveness of surface cleaning using an acetone/ethanol mixture was similar to that of piranha solution (sulfuric acid/hydrogen peroxide). Thus, we employed surface cleaning with an acetone/ethanol mixture en route toward the fabrication of a series of label-free, back-gated, 60-nm nanowire field-effect transistor (NWFET) sensors for the detection of the BRAFV599E oncogene. We applied the NWFET sensor to the successful detection of the hybridization and dehybridization processes of the BRAFV599E mutation gene.
UR - http://www.scopus.com/inward/record.url?scp=77951660138&partnerID=8YFLogxK
U2 - 10.1109/INEC.2010.5425155
DO - 10.1109/INEC.2010.5425155
M3 - Conference contribution
AN - SCOPUS:77951660138
SN - 9781424435449
T3 - INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings
SP - 872
EP - 873
BT - INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings
T2 - 2010 3rd International Nanoelectronics Conference, INEC 2010
Y2 - 3 January 2010 through 8 January 2010
ER -