Multiple-fault diagnosis using faulty-region identification

Meng Jai Tasi*, Chia-Tso Chao, Jing Yang Jou, Meng Chen Wu

*此作品的通信作者

    研究成果: Conference contribution同行評審

    7 引文 斯高帕斯(Scopus)

    摘要

    The fault diagnosis has become an increasing portion of today's IC-design cycle and significantly determines product's time-to-market. However, the failure behaviors from the defective chips may not be fully represented by the single fault model. In this paper, we propose a fault-diagnosis framework targeting multiple stuck-at faults. This framework first reports a minimal suspect region, in which all real faults are topologically covered. Next, a proposed ranking method is applied to sieve out the real faults from the candidates within the suspect region. The experimental results show that the proposed diagnosis framework can effectively locate the multiple stuck-at faults within a neighborhood, which may generate erroneous signals cancelling one another and are difficult to be diagnosed based on a single-fault-model method.

    原文English
    主出版物標題Proceedings - 2009 27th IEEE VLSI Test Symposium, VTS 2009
    頁面123-128
    頁數6
    DOIs
    出版狀態Published - 2009
    事件2009 27th IEEE VLSI Test Symposium, VTS 2009 - Santa Cruz, CA, United States
    持續時間: 3 5月 20097 5月 2009

    出版系列

    名字Proceedings of the IEEE VLSI Test Symposium

    Conference

    Conference2009 27th IEEE VLSI Test Symposium, VTS 2009
    國家/地區United States
    城市Santa Cruz, CA
    期間3/05/097/05/09

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