摘要
A new multiple-cell square-type layout design is proposed to realize the large-dimension output transistors for submicron low-voltage CMOS ICs. By using this layout design, the layout area of CMOS output buffers can be effectively reduced 30-40% with respect to the traditional finger-type layout. The drain-to-bulk parasitic capacitance of the output transistors is also reduced 40% by this square-type layout. Experimental results in a 0.6 μm CMOS process have shown that the maximum driving (sinking) capability per unit layout area of a CMOS output buffer realized by the proposed multiple-cell square-type layout is improved 54% (34%) more than that by the traditional finger-type layout. The human-body-model (machine-model) ESD robustness per unit layout area of the CMOS output buffer realized by the proposed multiple-cell square-type layout is increased 25.2% (17.3%) as comparing to that by the traditional finger-type layout.
原文 | English |
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頁(從 - 到) | 1007-1014 |
頁數 | 8 |
期刊 | Solid-State Electronics |
卷 | 42 |
發行號 | 6 |
DOIs | |
出版狀態 | Published - 1 1月 1998 |