TY - JOUR
T1 - Multi-level memory systems using error control codes
AU - Chang, Hsie-Chia
AU - Lin, Chien Ching
AU - Hsiao, Tien Yuan
AU - Wu, Jieh-Tsorng
AU - Wang, Ta-Hui
PY - 2004
Y1 - 2004
N2 - In this paper, the multi-level memory system using error control codes has been proposed. As compared with other approaches for 2m-level memory cells, our proposal features an effective grouping of several q-level memory cells with q > 2m in order to create parity bits of error control codes. Therefore, the proposed methodology can enhance both the yield and reliability without area penalty for multilevel memory systems. The BCH (72,64) code of correcting single error is presented for 5-level memory cells. In contrast to 22-level memory cells, our proposal can improve yields from 61.58% to 99.92% for 16Mbit and make the mass production of 1Gbit memory practicable under the approximated model for StrataFlash™. Since our work was motivated from the use of q-level cells in substitution for 2 m-level cells, not only multi-level flash memory, but also multi-level DRAM systems, can both benefit from our proposed methodology.
AB - In this paper, the multi-level memory system using error control codes has been proposed. As compared with other approaches for 2m-level memory cells, our proposal features an effective grouping of several q-level memory cells with q > 2m in order to create parity bits of error control codes. Therefore, the proposed methodology can enhance both the yield and reliability without area penalty for multilevel memory systems. The BCH (72,64) code of correcting single error is presented for 5-level memory cells. In contrast to 22-level memory cells, our proposal can improve yields from 61.58% to 99.92% for 16Mbit and make the mass production of 1Gbit memory practicable under the approximated model for StrataFlash™. Since our work was motivated from the use of q-level cells in substitution for 2 m-level cells, not only multi-level flash memory, but also multi-level DRAM systems, can both benefit from our proposed methodology.
UR - http://www.scopus.com/inward/record.url?scp=4344680671&partnerID=8YFLogxK
U2 - 10.1109/ISCAS.2004.1329291
DO - 10.1109/ISCAS.2004.1329291
M3 - Conference article
AN - SCOPUS:4344680671
SN - 0271-4310
VL - 2
SP - II393-II396
JO - Proceedings - IEEE International Symposium on Circuits and Systems
JF - Proceedings - IEEE International Symposium on Circuits and Systems
T2 - 2004 IEEE International Symposium on Cirquits and Systems - Proceedings
Y2 - 23 May 2004 through 26 May 2004
ER -