Monolayer-MoS2 Stacked Nanosheet Channel with C-type Metal Contact

Yun Yan Chung*, Wei Sheng Yun, Bo Jhih Chou, Chen Feng Hsu, Shao Ming Yu, G. Arutchelvan, Ming Yang Li, Tsung En Lee, Bo Jiun Lin, Chen Yi Li, Aslan Wei, D. Mahaveer Sathaiya, Cheng Ting Chung, San Lin Liew, Vincent D.H. Hou, Wen Hao Chang, Bo Heng Liu, Chien Wei Chen, Chien Ying Su, Chi Chung KeiJin Cai, Chung Cheng Wu, Jeff Wu, Tung Ying Lee, Chao Hsin Chien*, Chao Ching Cheng*, Iuliana P. Radu*

*此作品的通信作者

研究成果: Conference contribution同行評審

3 引文 斯高帕斯(Scopus)

摘要

This work demonstrates the first stacked nanosheet devices with monolayer MoS2 channel after successful simultaneous release of 2 nanosheets. Two-stacked monolayer MoS2 nanosheets with 50-nm width can be released free up to 150 nm, proving excellent mechanical properties of the channel material. Conformal gate stack deposition on the 2-stacked MoS2 sheets is confirmed. To increase contact area, we introduce here 'C-type' wrap-around contact that contacts not only the edge but also the top and bottom side on the monolayer MoS2 channels. For the first time, studies of gate stack and its impact on subthreshold swing, threshold voltage and hysteresis are presented on single nanosheet gate all around (GAA) devices. Unlike most reports in literature of depletion-mode monolayer MoS2 devices, through appropriate process control and interface engineering we report here positive threshold voltage for NMOS devices.

原文English
主出版物標題2023 International Electron Devices Meeting, IEDM 2023
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9798350327670
DOIs
出版狀態Published - 2023
事件2023 International Electron Devices Meeting, IEDM 2023 - San Francisco, United States
持續時間: 9 12月 202313 12月 2023

出版系列

名字Technical Digest - International Electron Devices Meeting, IEDM
ISSN(列印)0163-1918

Conference

Conference2023 International Electron Devices Meeting, IEDM 2023
國家/地區United States
城市San Francisco
期間9/12/2313/12/23

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