Modeling the Switch-Induced Error Voltage on a Switched-Capacitor

Bing J. Sheu, Chen-Ming Hu

研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)

摘要

An analytical model for switch-induced error voltage on a switched capacitor is derived. A compact expression contains the effects of gate voltage falling rate, threshold voltage, and storage capacitance. It can be used to quickly predict the error voltage. The model is in good agreement with computer simulations using SPICE program and experiment.

原文English
頁(從 - 到)911-913
頁數3
期刊IEEE transactions on circuits and systems
30
發行號12
DOIs
出版狀態Published - 1 1月 1983

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