Modeling the parasitic capacitance of ESD protection SCR to Co-design matching network in RF ICs

Chun Yu Lin*, Ming-Dou Ker

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    研究成果: Conference contribution › 同行評審

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    深入研究「Modeling the parasitic capacitance of ESD protection SCR to Co-design matching network in RF ICs」主題。共同形成了獨特的指紋。

    Engineering & Materials Science