Mitigating effects of non-ideal synaptic device characteristics for on-chip learning

Pai Yu Chen, Binbin Lin, I. Ting Wang, Tuo-Hung Hou, Jieping Ye, Sarma Vrudhula, Jae Sun Seo, Yu Cao, Shimeng Yu

研究成果: Conference contribution同行評審

167 引文 斯高帕斯(Scopus)

摘要

The cross-point array architecture with resistive synaptic devices has been proposed for on-chip implementation of weighted sum and weight update in the training process of learning algorithms. However, the non-ideal properties of the synaptic devices available today, such as the nonlinearity in weight update, limited ON/OFF range and device variations, can potentially hamper the learning accuracy. This paper focuses on the impact of these realistic properties on the learning accuracy and proposes the mitigation strategies. Unsupervised sparse coding is selected as a case study algorithm. With the calibration of the realistic synaptic behavior from the measured experimental data, our study shows that the recognition accuracy of MNIST handwriting digits degrades from ?97 % to ?65 %. To mitigate this accuracy loss, the proposed strategies include 1) the smart programming schemes for achieving linear weight update; 2) a dummy column to eliminate the off-state current; 3) the use of multiple cells for each weight element to alleviate the impact of device variations. With the improved synaptic behavior by these strategies, the accuracy increases back to ?95 %, enabling the reliable integration of realistic synaptic devices in the neuromorphic systems.

原文English
主出版物標題2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015
發行者Institute of Electrical and Electronics Engineers Inc.
頁面194-199
頁數6
ISBN(電子)9781467383882
DOIs
出版狀態Published - 5 1月 2016
事件34th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015 - Austin, United States
持續時間: 2 11月 20156 11月 2015

出版系列

名字2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015

Conference

Conference34th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015
國家/地區United States
城市Austin
期間2/11/156/11/15

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