Microstructure analysis and tensile strength of low temperature Cu bonds using highly-<111> Cu

Jia Juen Ong, Kai Cheng Shie, Chih Chen

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

摘要

This investigation shows bonding strength improvement by adjusting the microstructures in the Cu joints. The Cu pad used in this investigation is nanotwinned Cu pad with surface ratio more than 95% <111> preferred oriented. Result showed that bonding strength can be obtained in low temperature and pressure applied and short time during bonding process. Once the bonding time or pressure increases, recrystallization and grain growth triggered. By adjusting bonding time or bonding temperature, the microstructure in Cu pad can be controlled thus the bonding strength can be improved by adjusting microstructures in the Cu pads.

原文English
主出版物標題2021 7th International Workshop on Low Temperature Bonding for 3D Integration, LTB-3D 2021
發行者Institute of Electrical and Electronics Engineers Inc.
頁面25
頁數1
ISBN(電子)9781665405676
DOIs
出版狀態Published - 5 10月 2021
事件7th International Workshop on Low Temperature Bonding for 3D Integration, LTB-3D 2021 - Virtual, Online, 日本
持續時間: 5 10月 202111 10月 2021

出版系列

名字2021 7th International Workshop on Low Temperature Bonding for 3D Integration, LTB-3D 2021

Conference

Conference7th International Workshop on Low Temperature Bonding for 3D Integration, LTB-3D 2021
國家/地區日本
城市Virtual, Online
期間5/10/2111/10/21

指紋

深入研究「Microstructure analysis and tensile strength of low temperature Cu bonds using highly-<111> Cu」主題。共同形成了獨特的指紋。

引用此