Mechanism of snapback failure induced by the latch-up test in high-voltage CMOS integrated circuits

Jen Chou Tseng*, Yu Lin Chen, Chung Ti Hsu, Fu Yi Tsai, Po An Chen, Ming-Dou Ker

*此作品的通信作者

    研究成果: Conference contribution › 同行評審

    3 引文 斯高帕斯（Scopus）

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    Engineering & Materials Science