Mechanism of Degradation of Ge NMOSFET with Channel Ion Implantation and Its Recovery

Bing Yue Tsui*, Yu Chen Chang, Yi Ju Chen

*此作品的通信作者

研究成果: Conference contribution同行評審

指紋

深入研究「Mechanism of Degradation of Ge NMOSFET with Channel Ion Implantation and Its Recovery」主題。共同形成了獨特的指紋。

Engineering

Material Science

Keyphrases