Mechanism for photon emission from Au nano-hemispheres induced by scanning tunneling microscopy

Ian Liau, Norbert F. Scherer*

*此作品的通信作者

研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)

摘要

The photon emission yield observed in scanning tunneling microscopy (STM) measurements of Au hemispheroid-decorated thin films is used to elucidate the interaction of tunneling electrons with local surface plasmon modes. The photon emission probability is found to depend on the surface feature size. The agreement of a model calculation with the experimental results demonstrates that inelastic electron tunneling is the dominant mechanism of STM-induced plasmon excitation for 10-60 nm size metallic features.

原文English
頁(從 - 到)3966-3968
頁數3
期刊Applied Physics Letters
74
發行號26
DOIs
出版狀態Published - 28 6月 1999

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