Mechanical bending effect on the photo leakage currents characteristic of amorphous silicon thin film transistors

M. C. Wang, S. W. Tsao, T. C. Chang, Y. P. Lin, Po-Tsun Liu, J. R. Chen

研究成果: Article同行評審

2 引文 斯高帕斯(Scopus)

指紋

深入研究「Mechanical bending effect on the photo leakage currents characteristic of amorphous silicon thin film transistors」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy