Measuring the thickness of transparent objects using a confocal displacement sensor

Chun Jen Weng, Bo Rong Lu, Pi-Ying Cheng, Chi Hung Hwang, Chih Yen Chen

    研究成果: Conference contribution同行評審

    6 引文 斯高帕斯(Scopus)

    摘要

    This paper reports on a confocal displacement sensor with varifocal lens used to measure the thickness of transparent materials. The focal length of the varifocal lens is adjusted by varying the current. Laser light passing through a transparent target lying within the range of the focal length crosses two interfaces; i.e., first from air to glass and then from glass to air. The signals associated with the interface were of higher intensity than that measure at other points along the z axis. A power meter is used to measure the power and LabVIEW is used to record a power-current graph. The current gap between the two peaks can be translated into values of displacement, indicating the thickness of the material.

    原文English
    主出版物標題I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
    發行者Institute of Electrical and Electronics Engineers Inc.
    ISBN(電子)9781509035960
    DOIs
    出版狀態Published - 5 七月 2017
    事件2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017 - Torino, Italy
    持續時間: 22 五月 201725 五月 2017

    出版系列

    名字I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings

    Conference

    Conference2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017
    國家/地區Italy
    城市Torino
    期間22/05/1725/05/17

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